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Job strain as a risk factor for clinical depression: systematic review and meta-analysis with additional individual participant data
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- Psychological Medicine / Volume 47 / Issue 8 / June 2017
- Published online by Cambridge University Press:
- 26 January 2017, pp. 1342-1356
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X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
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- 29 February 2012, pp. 99-103
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Contributors
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- The Cambridge Dictionary of Christianity
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- 05 August 2012
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- 20 September 2010, pp xi-xliv
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Schistosomiasis and neglected tropical diseases: towards integrated and sustainable control and a word of caution
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- Parasitology / Volume 136 / Issue 13 / November 2009
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- 11 November 2009, pp. 1859-1874
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Inhibition of malarial invasion by intracellular antibodies against intrinsic membrane proteins in the red cell
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- Parasitology / Volume 93 / Issue 3 / December 1986
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- 06 April 2009, pp. 427-431
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Towards a comprehensive simulation model of malaria epidemiology and control
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- Parasitology / Volume 135 / Issue 13 / November 2008
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- 11 August 2008, pp. 1507-1516
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Effect Of No On The Electrical Characteristics Of SiO2 Grown On P-Type 4H SiC
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- MRS Online Proceedings Library Archive / Volume 512 / 1998
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- 10 February 2011, 223
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- 1998
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Nitrided Gate Dielectrics and Charge-to-Breakdown Test
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- MRS Online Proceedings Library Archive / Volume 429 / 1996
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- 10 February 2011, 239
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- 1996
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Combined Room Temperature Photoluminescence And High Resolution X-Ray Diffraction Mapping Of Semiconductor Wafers
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- MRS Online Proceedings Library Archive / Volume 406 / 1995
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- 15 February 2011, 555
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- 1995
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A Novel Dumond Monochromator for High-Resolution X-ray Diffraction
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 361-369
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- 1994
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High Resolution X-ray Diffractometry and Topography of Float-Zone GaAs Crystals Grown in Microgravity
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 195-200
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- 1994
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New Methods for the Accurate Comparison of Lattice Parameters
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 123-128
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- 1993
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New Algorithms for Rapid Full-Wafer Mapping by High Resolution Double Axis X-Ray Diffraction
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- MRS Online Proceedings Library Archive / Volume 324 / 1993
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- 22 February 2011, 451
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- 1993
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Optical Absorption, Luminescence, And Redox Switching Properties Of Polyphenylene Derivatives
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- MRS Online Proceedings Library Archive / Volume 328 / 1993
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- 16 February 2011, 191
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- 1993
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Experimental Comparison of Widely Differing Lattice Parameters
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 129-133
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- 1993
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High Resolution X-Ray Diffraction of Hg1-xMnx Te Epitaxial Films
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- MRS Online Proceedings Library Archive / Volume 280 / 1992
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- 25 February 2011, 635
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- 1992
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Grazing Incidence X-Ray Reflectometry Studies of Cadmium Arachidate Langmuir-Blodgett Films
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- MRS Online Proceedings Library Archive / Volume 237 / 1991
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- 21 February 2011, 281
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- 1991
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Thermal Degradation of SiGe Interfaces Studied by X-Ray Reflectivity and Diffraction
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- MRS Online Proceedings Library Archive / Volume 239 / 1991
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- 22 February 2011, 455
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- 1991
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Principles and Performance of a PC-Based Program for Simulation of Grazing Incidence X-Ray Reflectivity Profiles
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- MRS Online Proceedings Library Archive / Volume 238 / 1991
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- 25 February 2011, 119
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- 1991
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A Grazing Incidence X-Ray Reflectometer for Rapid Nondestructive Characterization of Thin Films and Interfaces
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- MRS Online Proceedings Library Archive / Volume 240 / 1991
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- 26 February 2011, 219
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- 1991
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